Reliability Characterisation of Electrical and Electronic Systems

Voorkant
Elsevier, 24 dec 2014 - 274 pagina's

This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices.

The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications.

  • Takes a holistic approach to reliability engineering
  • Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability
  • Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation
 

Geselecteerde pagina's

Inhoudsopgave

Introduction
1
Reliability and stupidity
11
Physicsoffailure PoF methodology for electronic reliability
27
Modern instruments for characterizing degradation in electrical and electronic equipment
43
Reliability building of discrete electronic components
63
Reliability of optoelectronics
83
Reliability of silicon integrated circuits
115
Reliability of emerging nanodevices
143
Design considerations for reliable embedded systems
169
Reliability approaches for automotive electronic systems
195
Reliability modeling and accelerated life testing for solar power generation systems
215
Index
251
Copyright

Veelvoorkomende woorden en zinsdelen

A.S. Oates acceleration factor analysis Appl application checkpointing approach assessment Automation BH laser burn-in Calibre PERC capacitors cause circuit reliability components cost current density damage defects degradation Device Mater dielectric breakdown diodes effect electromigration Electron Devices electronic systems electrostatic discharge embedded systems energy ESD threshold estimate etch example failure mechanisms failure modes failure rate function gate dielectric hardware identify IEEE IEEE Trans improve increase InGaAs integrated circuits interconnects interface International Reliability Physics layer layout lifetime logic low-k manufacturing materials measured Mentor Graphics metal methods modules MOSFET NBTI operating optical oxide parameters Pecht performance Phys PoF models reliabil Reliability Characterisation reliability engineering reliability engineering activities Reliability Physics Symposium sample Schottky diodes silicon soft errors solar power solder specific stress substrate surface TDDB techniques thermal cycling threshold current transistor typically verification voiding voltage wear-out

Bibliografische gegevens

TitelReliability Characterisation of Electrical and Electronic Systems
Woodhead Publishing Series in Electronic and Optical Materials
BijdragerElsevier Science
UitgeverElsevier, 2014
ISBN1782422250, 9781782422259
Lengte274 pagina's
  
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